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Speaker: Burc Misirlioglu
Advisor: S. Pamir Alpay
Bio: Burc Misirlioglu got his B.S. and M.S. degrees in
Metallurgical Engineering from
Istanbul Technical
University.
He was involved in the microstructural and chemical characterization of the
catalytic converters of gasoline vehicles for his M.S. degree. He is currently enrolled as a
Ph.D. student at the University
of Connecticut
in the Department of Materials
Science&Engineering. His research is on the effects of defects such as
dislocations on the properties of ferroelectric thin films and is also
conducting research on PLD growth of ferroelectric thin films to study
structural characteristics of phase transformations in ferroelectric thin films.
Topic:
A Challenge Awaiting Nanoscale Device Engineering: Supression of
Ferroelectricity in Ultrathin Epitaxial Thin Films
Abstract:
Dislocations are the most common type of secondary defects and are unavoidably
present in all crystalline materials. They have been observed in ferroelectric
materials as in many other materials systems. Ferroelectrics have gained great
interest due to their special properties such as spontaneous polarization,
electric field dependent high dielectric constant and pyroresponse. When in
ferroelectric films, dislocations severely effect the physical properties of the
films designed for various applications confirmed by several experimental
studies. In this study, we supply experimental and theoretical evidence to
explain why they may have a significant impact on the degradation of the
electrical properties and change the phase transformation characteristics in
epitaxial ferroelectric thin films.
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